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Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than of 250 nm)

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F98%3APU37579" target="_blank" >RIV/00216305:26220/98:PU37579 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Locally resolved topography and spectroscopy of semiconductors (with lateral resolution better than of 250 nm)

  • Original language description

    Locally resolved topography of semiconductor surface and jonction has been investigated and first results presnted.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/OC%20523.40" target="_blank" >OC 523.40: Nanostructures: Optical and Electrical Characteristics</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    1998

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proc. of 5th Int.Conf. Electronic devices and systems 1998

  • ISBN

    80-214-1198-8

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    173-176

  • Publisher name

    Neuveden

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Nov 30, 1998

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article