Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F03%3APU42539" target="_blank" >RIV/00216305:26230/03:PU42539 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers
Original language description
The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved salt and pepper noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
The 2003 NASA/DoD Conference on Evolvable Hardware
ISBN
0-7695-1977-6
ISSN
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e-ISSN
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Number of pages
10
Pages from-to
135-144
Publisher name
IEEE Computer Society Press
Place of publication
Los Alamitos
Event location
Chicago
Event date
Jul 9, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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