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Parasitic Effects in Electronic Circuits Simulations

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F05%3APU56499" target="_blank" >RIV/00216305:26230/05:PU56499 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Parasitic Effects in Electronic Circuits Simulations

  • Original language description

    Solving electrical circuits is a typical problem leading to solving differenctial equations. Some complications appear in the case when we consider parasitic parameters of the circuit (such as parasitic resistance, inductance or capacity). Even a simplesystem of differential equation describing its model may become very stiff easilly. Stiff systems appear in simulation of electrical circuits very often.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F04%2F0871" target="_blank" >GA102/04/0871: Information system security - research of attacks on tamper-resistant cryptographic hardware</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 39th International Conference MOSIS '05

  • ISBN

    80-86840-10-7

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

  • Publisher name

    NEUVEDEN

  • Place of publication

    Ostrava

  • Event location

    Hradec nad Moravicí

  • Event date

    Apr 19, 2005

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article