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FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F06%3APU66893" target="_blank" >RIV/00216305:26230/06:PU66893 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    FITTest_BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

  • Original language description

    In the paper, the FITTest_BENCH06 set of synthetic benchmark circuits is presented for the evaluation of diagnostic methods and tools. The structure of benchmark circuits together with their diagnostic properties is described. The set consists of 31 circuits at various levels of complexity (2000, 10000, 28000, 100000, 150000 and 300000 gates). Four circuits with different diagnostic properties are available for each level of circuit complexity (fault coverage is approx. 0%, 33%, 66% and 100%). The benchmark circuits are available both at the register transfer level and the gate level. In addition to the benchmark set, a method is described that was used to develop benchmark circuits with required complexity and diagnostic properties.

  • Czech name

    FITTest_BENCH06: Nová sada testovacích obvodů zohledňující jejich testovatelnost

  • Czech description

    V příspěvku je představena sada syntetických testovacích obvodů FITTest_BENCH06 určená pro ověřování diagnostických metod a nástrojů. Sada se skládá z 31 obvodů na čtyřech úrovních složitosti (2000, 10000, 28000, 100000, 150000 a 300000 hradel), přičemžpro každou úroveň složitosti jsou k dispozici 4 úrovně testovatelnosti (pokrytí poruch 0%, 33%, 66% a 100%). Součástí příspěvku je také krátké představení návrhové metody použité pro vytvoření těcto obvodů.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2006

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proc. of 2006 IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop

  • ISBN

    1424401844

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    285-289

  • Publisher name

    IEEE Computer Society

  • Place of publication

    Praha

  • Event location

    Praha

  • Event date

    Apr 18, 2006

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article