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The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F10%3APU89622" target="_blank" >RIV/00216305:26230/10:PU89622 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    The Use of Genetic Algorithm to Derive Correlation Between Test Vector and Scan Register Sequences and Reduce Power Consumption

  • Original language description

    In most of existing approaches, the reorganization of test vector sequence and reordering scan chains registers to reduce power consumption are solved separately, they are seen as independent procedures. In the paper it is shown that a&nbsp; correlationbetween these two processes and strong reasons to combine them into one procedure run concurrently exist. Based on this idea, it is demonstrated that search spaces of both procedures can be combined together into a single search space in order to achievebetter results during the optimization process. The optimization over the united search space was tested on ISCAS85, ISCAS89 and ITC99 benchmark circuits implemented by means of CMOS primitives from AMI technological libraries. Results presented in thepaper show that lower power consumption can be achieved if the correlation is reflected, i.e., if the search space is united rather than divided into separate spaces. At the end of the paper, results achieved by genetic algorithm based op

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    IN - Informatics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F09%2F1668" target="_blank" >GA102/09/1668: SoC circuits reliability and availability improvement</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 13th Euromicro Conference on Digital System Design Architectures, Methods and Tools

  • ISBN

    978-0-7695-4171-6

  • ISSN

  • e-ISSN

  • Number of pages

    8

  • Pages from-to

  • Publisher name

    IEEE Computer Society

  • Place of publication

    Los Alamitos

  • Event location

    Lille

  • Event date

    Sep 1, 2010

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article