Behavior of CMOS Polymorphic Circuits in High Temperature Environment
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F11%3APU96029" target="_blank" >RIV/00216305:26230/11:PU96029 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Behavior of CMOS Polymorphic Circuits in High Temperature Environment
Original language description
The paper describes a series of experiments performed with the aim to analyze the fundamental impact of high temperatures on behavior of polymorphic digital circuits. These experiments were conducted using a reconfigurable polymorphic chip REPOMO32 whichis configured (in addition to the configuration bit stream) using the level of power supply voltage (Vdd). Experiments show that polymorphic gates in the chip can be easily involved (in terms of functionality) not only by Vdd, but also by temperature. Because experiments also prove that the physical design of the REPOMO32 chip is robust enough to keep the functionality of all circuitry of the REPOMO32 and its dynamic parameters are stable enough under wide range of operating temperature, the chip can also be used for future designs of digital polymorphic circuits controlled by temperature.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP103%2F10%2F1517" target="_blank" >GAP103/10/1517: Natural Computing on Unconventional Platforms</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
ISBN
978-1-4244-9753-9
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
447-452
Publisher name
IEEE Computer Society
Place of publication
Cottbus
Event location
Cottbus
Event date
Apr 13, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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