International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F19%3APU135760" target="_blank" >RIV/00216305:26230/19:PU135760 - isvavai.cz</a>

Result on the web

<a href="https://www.fit.vut.cz/research/publication/12200/" target="_blank" >https://www.fit.vut.cz/research/publication/12200/</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/ITC44170.2019.9000137" target="_blank" >10.1109/ITC44170.2019.9000137</a>

Result language

angličtina

Original language name

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

Original language description

The paper is a contribution to the 50th anniversary celebration of the International Test Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years. It covers the past, present, and future of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test technology related events initiated and supported by the ITC.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

20206 - Computer hardware and architecture

Project

—

Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2019

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

2019 IEEE International Test Conference

ISBN

978-1-7281-4823-6

ISSN

—

e-ISSN

—

Number of pages

4

Pages from-to

1-4

Publisher name

Institute of Electrical and Electronics Engineers

Place of publication

Washington, DC

Event location

Washington, DC

Event date

Nov 9, 2019

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

000540385000026