Automatic particle analysis for microgeology
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F22%3APR37553" target="_blank" >RIV/00216305:26230/22:PR37553 - isvavai.cz</a>
Result on the web
<a href="https://www.fit.vut.cz/research/product/768/" target="_blank" >https://www.fit.vut.cz/research/product/768/</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Automatic particle analysis for microgeology
Original language description
This software implements methods for automated recognition of particles in images from scanning electron microscope (SEM). The input is image of backscattered electrons (BSE), the output is per-pixel labels identifying individual particles. This task is hard to solve with current methods since many particles are often perceived as one connected area. Two methods are implemented. The first analyzes contour of an area and employs mechanical rules in order to propose points where compound particles break. The second method uses neural networks to determine boundary pixels of the individual particles.
Czech name
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Czech description
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Classification
Type
R - Software
CEP classification
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OECD FORD branch
20206 - Computer hardware and architecture
Result continuities
Project
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Continuities
N - Vyzkumna aktivita podporovana z neverejnych zdroju
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Internal product ID
TESCAN-PARTICLES
Technical parameters
Pro informace o licencích se obratte na Roman Juranek - ijuranek@fit.vutbr.cz
Economical parameters
Jedná se o výsledek smluvního výzkumu vypracovaný za úplatu k využití v TESCAN.
Owner IČO
00216305
Owner name
Vysoké učení technické v Brně