Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F12%3APU94258" target="_blank" >RIV/00216305:26310/12:PU94258 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Electron Ionization of Dimethylphenylsilane - Appearance Energies of Selected Ionic Fragments

Original language description

Electron ionization (EI) to dimethylphenylsilane (DMPS) is studied in crossed electron-molecular beams experiment. Using this technique with improved energy resolution of the electron beam, the positive mass spectra and the relative partial cross sections for EI to DMPS are obtained. The ionization energy of DMPS of 9.04 +- 0.06eV and the threshold energies for dissociative ionization channels are estimated. The bond dissociation energies for single bond cleavage channels are also estimated on the basisof experimental observations. The detection of doubly charged ions of DMPS2+ (AE=26.3 +- eV) as well as several other doubly charged fragments is discussed in detail.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BL - Plasma physics and discharge through gases

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2012

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Plasma Processes and Polymers

ISSN

1612-8869

e-ISSN

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Volume of the periodical

9

Issue of the periodical within the volume

3

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

298-303

UT code for WoS article

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EID of the result in the Scopus database

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