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The impact of Ir doping on the electrical properties of YbFe1-xIrxO3 perovskite-oxide compounds

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F20%3APU139192" target="_blank" >RIV/00216305:26620/20:PU139192 - isvavai.cz</a>

  • Result on the web

    <a href="https://link.springer.com/article/10.1007/s10854-019-02691-1" target="_blank" >https://link.springer.com/article/10.1007/s10854-019-02691-1</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1007/s10854-019-02691-1" target="_blank" >10.1007/s10854-019-02691-1</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    The impact of Ir doping on the electrical properties of YbFe1-xIrxO3 perovskite-oxide compounds

  • Original language description

    In this study, YbFe1-xIrxO3 (x = 0, 0.01, 0.10) compounds were synthesized by solid-state reaction method. Chemical and structural analyses of studied compounds were carried out by XPS, SEM and EDX methods. SEM and STEM studies have shown that the particle size shrinks as doping ratio increases. Electrical/dielectric properties of the synthesized compounds were performed in wide-range frequency (1-10(7) Hz) and temperature (between - 100 and 100 degrees C with 20 degrees C steps) using Novocontrol Dielectric/Impedance Spectrometer. Frequency-dependent loss tangent plots exhibited that three dielectric relaxations take place for undoped YbFeO3 (YbFO) compound, whereas two dielectric relaxations were observed for 1 and 10 mol% Ir-doped YbFO compounds. Resistivity measurement revealed that the 1 mol% Ir-substituted YbFO has lower resistivity than undoped.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

  • ISSN

    0957-4522

  • e-ISSN

    1573-482X

  • Volume of the periodical

    31

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    14

  • Pages from-to

    1731-1744

  • UT code for WoS article

    000514350200077

  • EID of the result in the Scopus database