Coherent x-ray scattering in an XPEEM setup
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F20%3APU139652" target="_blank" >RIV/00216305:26620/20:PU139652 - isvavai.cz</a>
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0304399120300759?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0304399120300759?via%3Dihub</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.ultramic.2020.113035" target="_blank" >10.1016/j.ultramic.2020.113035</a>
Alternative languages
Result language
angličtina
Original language name
Coherent x-ray scattering in an XPEEM setup
Original language description
X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20501 - Materials engineering
Result continuities
Project
<a href="/en/project/LM2015041" target="_blank" >LM2015041: CEITEC Nano</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Ultramicroscopy
ISSN
0304-3991
e-ISSN
1879-2723
Volume of the periodical
216
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
8
Pages from-to
„113035-1“-„113035-8“
UT code for WoS article
000570058500001
EID of the result in the Scopus database
2-s2.0-85086299521