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Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F21%3APU138751" target="_blank" >RIV/00216305:26620/21:PU138751 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.mdpi.com/1424-8220/21/1/238" target="_blank" >https://www.mdpi.com/1424-8220/21/1/238</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3390/s21010238" target="_blank" >10.3390/s21010238</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

  • Original language description

    In this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal-oxide-semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts' detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample's structure.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    SENSORS

  • ISSN

    1424-8220

  • e-ISSN

    1424-3210

  • Volume of the periodical

    21

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    20

  • Pages from-to

    1-20

  • UT code for WoS article

    000606236100001

  • EID of the result in the Scopus database