Influence of primary beam energy on localized surface plasmon resonances mapping by STEM-EELS
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F21%3APU141687" target="_blank" >RIV/00216305:26620/21:PU141687 - isvavai.cz</a>
Result on the web
<a href="https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/influence-of-primary-beam-energy-on-localized-surface-plasmon-resonances-mapping-by-stemeels/E0BF93B4BD78DB6102DDC98187A4200C" target="_blank" >https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/influence-of-primary-beam-energy-on-localized-surface-plasmon-resonances-mapping-by-stemeels/E0BF93B4BD78DB6102DDC98187A4200C</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927621002828" target="_blank" >10.1017/S1431927621002828</a>
Alternative languages
Result language
angličtina
Original language name
Influence of primary beam energy on localized surface plasmon resonances mapping by STEM-EELS
Original language description
We have discussed the impact on experimental characteristics which are important to detect localized surface plasmon peaks in EELS successfully, namely: the intensity of plasmonic signal, the signal to background ratio, and the signal to zero-loss peak ratio considering a limited dynamic range of the spectrometer camera.
Czech name
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Czech description
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Classification
Type
J<sub>ost</sub> - Miscellaneous article in a specialist periodical
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/LM2018110" target="_blank" >LM2018110: CzechNanoLab research infrastructure</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
1435-8115
Volume of the periodical
27
Issue of the periodical within the volume
S1
Country of publishing house
US - UNITED STATES
Number of pages
3
Pages from-to
686-688
UT code for WoS article
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EID of the result in the Scopus database
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