All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU151614" target="_blank" >RIV/00216305:26620/24:PU151614 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/pii/S266652392300168X?via%3Dihub</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsadv.2023.100534" target="_blank" >10.1016/j.apsadv.2023.100534</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

  • Original language description

    Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10400 - Chemical sciences

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science Advances

  • ISSN

    2666-5239

  • e-ISSN

  • Volume of the periodical

    19

  • Issue of the periodical within the volume

    100534

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    29

  • Pages from-to

    „“-„“

  • UT code for WoS article

    001153645800001

  • EID of the result in the Scopus database

    2-s2.0-85183432077