Failure of electric devices due to H2S
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F25794787%3A_____%2F17%3AN0000037" target="_blank" >RIV/25794787:_____/17:N0000037 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Failure of electric devices due to H2S
Original language description
Copper is widely used metal for industrial and public purposes due to its good corrosion resistance and excellent electrical conductivity. In indoor atmospheric environments without air pollution the corrosion rate of copper is very low and it is not affected by slight increasing of temperature or relative humidity. In many indoor environment hydrogen sulphide (H2S) occurs and significantly affects the copper corrosion. CuS is a loose of black corrosion product which can’t form protective film on copper surface and promote corrosion by adsorption of moisture as carrier. In the case of HS- presence, the corrosion product is chalcocite Cu2S. Copper corrosion attack by H2S low concentration caused significant failure of electronic, electric equipment but also other copper parts as tubes, etc. These corrosion films can form an insulating layer on the contact surfaces causing electrical failures on the electronic devices. This paper is contained in Proceedings of EUROCORR 2017 (Prague, Czech Republic).
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
10405 - Electrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů