Test Pattern Decompression Using a Scan Chain
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F01%3A00000027" target="_blank" >RIV/46747885:24220/01:00000027 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Test Pattern Decompression Using a Scan Chain
Original language description
The article describes Test Pattern Decompression Using a Scan Chain
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F0566" target="_blank" >GA102/01/0566: Built-in self test equipment optimisation methods in integrated circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proc. of the 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISBN
0-7695-1203-8
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
110-115
Publisher name
IEEE
Place of publication
San Francisco, California
Event location
San Francisco, California
Event date
Oct 24, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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