BIST&DFT seminar
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F02%3A00000004" target="_blank" >RIV/46747885:24220/02:00000004 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
BIST&DFT seminar
Original language description
This seminar is devoted to the university students, PhD. students and to the designers from local companies which have to design easy-testable and highly reliable FPGA's and full-custom IC's.
Czech name
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Czech description
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Classification
Type
W - Workshop organization
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F0566" target="_blank" >GA102/01/0566: Built-in self test equipment optimisation methods in integrated circuits</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Event location
Liberec, Czech
Event country
CZ - CZECH REPUBLIC
Event starting date
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Event ending date
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Total number of attendees
4
Foreign attendee count
0
Type of event by attendee nationality
CST - Celostátní akce