About the measurement of the d33 piezoelectric coefficient of the PZT film - Si/SiO2/Ti/Pt substrates using an optical cryostat.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F03%3A00000014" target="_blank" >RIV/46747885:24220/03:00000014 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
About the measurement of the d33 piezoelectric coefficient of the PZT film - Si/SiO2/Ti/Pt substrates using an optical cryostat.
Original language description
The measurement of d33 piezoelectric coefficient of the PZT thin film on substrate Si/SiO2/Ti/Pt and its dependence on frequency and voltage in the room temperature is presented. The mesurements of the piezoelectric-induced displacements in the temperature range 240 K to 330 K were provided by a double beam miniaturized interferometer that was placed in optical helium cryostat.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Ferroelectrics
ISSN
0015-0193
e-ISSN
—
Volume of the periodical
vol. 292
Issue of the periodical within the volume
2003
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
103-109
UT code for WoS article
—
EID of the result in the Scopus database
—