Efficiency of test pattern decompression Techniques
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F03%3A00000045" target="_blank" >RIV/46747885:24220/03:00000045 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Efficiency of test pattern decompression Techniques
Original language description
The article describes the efficiency of test pattern decompression techniques.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F0566" target="_blank" >GA102/01/0566: Built-in self test equipment optimisation methods in integrated circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Radioelectronics & Informatics
ISSN
1563-0064
e-ISSN
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Volume of the periodical
3
Issue of the periodical within the volume
7, 2003
Country of publishing house
UA - UKRAINE
Number of pages
4
Pages from-to
19-22
UT code for WoS article
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EID of the result in the Scopus database
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