Comparison of test pattern decompression techniques
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F03%3A00000047" target="_blank" >RIV/46747885:24220/03:00000047 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Comparison of test pattern decompression techniques
Original language description
The paper compares test pattern decompression techniques.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F01%2F0566" target="_blank" >GA102/01/0566: Built-in self test equipment optimisation methods in integrated circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Design Automation and Test in Europe conference DATE03
ISBN
0-7695-1870-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
1182-1183
Publisher name
IEEE
Place of publication
Munich
Event location
Munich
Event date
Mar 3, 2003
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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