COMPAS - Compressed test pattern sequencer for scan based circuits

Result code in IS VaVaI
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Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
COMPAS - Compressed test pattern sequencer for scan based circuits
Original language description
This paper presents a software tool for test pattern compaction combined with compression of the test patterns to further reduce test data volume and time requirement. Usually the test set compaction is performed independently on test compression. We have implemented a test compaction and compression scheme that reorders test patterns previously generated in an ATPG in such a way that they are well suited for decompression. The compressed test sequence is decompressed in a scan chain. No design changesare required to be done in the functional part of the circuit. The tool is called COMPAS and it finds a sequence of overlapping patterns; each pattern detects a maximum number of circuit faults.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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