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Implementation of Dynamically Reconfigurable Test Archtecture for FPGA Circuits

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F08%3A%230001191" target="_blank" >RIV/46747885:24220/08:#0001191 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Implementation of Dynamically Reconfigurable Test Archtecture for FPGA Circuits

  • Original language description

    The paper is about Implementation of Dynamically Reconfigurable Test Archtecture for FPGA Circuits

  • Czech name

    Implementace dynamicky rekonfigurovatelné testovací architektury pro FPGA obvody

  • Czech description

    Článek je o implementaci dynamicky rekonfigurovatelné testovací architektury pro FPGA obvody

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/1QS108040510" target="_blank" >1QS108040510: Technology for improving the testability of modern digital circuits</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

  • ISBN

    978-1-4244-2276-0

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    Slovakia

  • Event location

    Bratislava

  • Event date

    Jan 1, 2008

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000256936300039