AmBRAMs - An Analysis Tool, Method and Framework for Advanced Measurements and Reliability Assessments on Modern Nanoscale FPGAs

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F15%3A%230003441" target="_blank" >RIV/46747885:24220/15:#0003441 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7293963" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?reload=true&arnumber=7293963</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/FPL.2015.7293963" target="_blank" >10.1109/FPL.2015.7293963</a>

Result language
angličtina
Original language name
AmBRAMs - An Analysis Tool, Method and Framework for Advanced Measurements and Reliability Assessments on Modern Nanoscale FPGAs
Original language description
Wide portfolio of new technologies in design and manufacturing of advanced integrated circuits enabled higher integration of complex structures at ultra-high nanoscale densities, however they are subjects to sensitivity to various changes of the internal nanostructures and their parameters, resulting in the requirement of advanced measurements and complex reliability assessments. This contribution presents a new concept of a lab-on-chip and a new unique software platform.
Czech name
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Czech description
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Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
25th International Conference on Field Programmable Logic and Applications, FPL 2015
ISBN
9780993428005
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
IEEE
Place of publication
London
Event location
London
Event date
Jan 1, 2015
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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