Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F47813059%3A19240%2F01%3A20000009" target="_blank" >RIV/47813059:19240/01:20000009 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer.
Original language description
The spectral interference of two beams from a white-light source, a tungsten halogen lamp, is measured at the output of a dispersive Michelson interferometer by a low-resolution miniature fiber optic spectrometer when the interferometer beam splitter ismade of fused silica. It is confirmed that the spectral interference fringes are resolved only in the vicinity of the equalization wavelength whose value is dependent on the group optical path difference in the interferometer. Thus, the equalization wavelength is measured as a function of the displacement in the interferometer in the spectral range approximately from 490 to 870 nm. Moreover, when the group refractive index of fused silica is evaluated at the equalization wavelengths by using the Sellmeier dispersion equation, it is confirmed, in accordance with the theory, that the measured displacement as a function of the group refractive index of fused silica is a straight line whose slope gives the effective thickness of the beam sp
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F01%2F0077" target="_blank" >GA202/01/0077: Waveguiding and magneto-optical reflection effects in thin films and low-dimensional systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design
ISBN
0-8194-4093-0
ISSN
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e-ISSN
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Number of pages
9
Pages from-to
229-23
Publisher name
SPIE-The International Society for Optical Engineering
Place of publication
Munich
Event location
Munich, Germany
Event date
Aug 18, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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