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Technical Challenges of Screen Printing Deposition for Ultra-fine Patterns

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F11%3A43897129" target="_blank" >RIV/49777513:23220/11:43897129 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Technical Challenges of Screen Printing Deposition for Ultra-fine Patterns

  • Original language description

    This paper presents a research focused on advanced screen printing technique development. In the paper it is shown that it is possible to realize structures with line width below 50 mým at the pitch below 100 mým and ultra-thin film deposition well below1 mým by advanced screen printing technique. Screen printing quality and its resolution relate to many factors such as the type of mesh, emulsion, paste, the thickness of emulsion and squeegee speed and its hardness. These printing parameters and many others were analyzed in the presented research project.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    ElectroScope

  • ISSN

    1802-4564

  • e-ISSN

  • Volume of the periodical

    2011

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    5

  • Pages from-to

    1-5

  • UT code for WoS article

  • EID of the result in the Scopus database