One-scan algorithm for arbitrarily oriented 1-D morphological opening and slope pattern spectrum
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F12%3A43921766" target="_blank" >RIV/49777513:23220/12:43921766 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
One-scan algorithm for arbitrarily oriented 1-D morphological opening and slope pattern spectrum
Original language description
This paper presents a fast, one-scan algorithm for 1-D morphological opening on 2-D support. The algorithm is further extended to compute the pattern spectrum during a single image scan. The structuring element (SE) can be oriented under arbitrary anglethat makes it possible to perform different orientation-involved image analysis, such as the local angle extraction, directional granulometry, etc. The algorithm processes an image in constant time regardless the SE orientation and size in one scan, withminimal latency and very low memory requirements. For pattern spectra, the C-implementation yields an experimental speed-up of 27x compared to other suitable solutions. Aforementioned properties allow for efficient implementation on hardware platforms such as GPU or FPGA that opens a new opportunity of parallel computation, and consequently, further speed-up.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 19th International conference on image processing
ISBN
978-1-4673-2533-2
ISSN
1522-4880
e-ISSN
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Number of pages
4
Pages from-to
133-136
Publisher name
IEEE
Place of publication
Lake Buena Vista, Florida
Event location
Lake Buena Vista, Florida, USA
Event date
Sep 30, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000319334900030