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Non-destructive detection methods for discontinuities of interconnection structures

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F16%3A43927492" target="_blank" >RIV/49777513:23220/16:43927492 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.emeraldinsight.com/doi/pdfplus/10.1108/MI-09-2014-0040" target="_blank" >http://www.emeraldinsight.com/doi/pdfplus/10.1108/MI-09-2014-0040</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1108/MI-09-2014-0040" target="_blank" >10.1108/MI-09-2014-0040</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Non-destructive detection methods for discontinuities of interconnection structures

  • Original language description

    The purpose of this paper is to demonstrate the non-destructive methods for detection and localization of interconnection structure discontinuities based on the signal analysis in the frequency and time domain. The paper deals with the discontinuity characterization of interconnection structures created on substrates used for electronics, and methods for their detection and localization, based on the frequency analysis of transmitted signals. Used analyses are based on the theoretical approach for the solution of discontinuity electrical parameters and are the base for diagnostic methods of discontinuity identification. The measurement results of reflection parameters, frequency spectrums of transmitted signals and characteristic impedance values are presented on test samples containing multiple line cracks and their width reduction. Obtained results can be used practically, not only for the detection of transmission lines discontinuities on printed circuit boards but also in other applications, such as the quality assessment of bonded joints. Developed methods allow the quick identification and localization of particular discontinuities without the destruction of tested devices.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronics International

  • ISSN

    1356-5362

  • e-ISSN

  • Volume of the periodical

    33

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    13

  • Pages from-to

    23-35

  • UT code for WoS article

    000370050300004

  • EID of the result in the Scopus database

    2-s2.0-84953897923