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Assessing the reliability of electrical insulating materials using accelerated againg tests

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F20%3A43959544" target="_blank" >RIV/49777513:23220/20:43959544 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/9214671" target="_blank" >https://ieeexplore.ieee.org/document/9214671</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/Diagnostika49114.2020.9214671" target="_blank" >10.1109/Diagnostika49114.2020.9214671</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Assessing the reliability of electrical insulating materials using accelerated againg tests

  • Original language description

    The paper summarizes the theoretical background of the accelerated aging test method of electrical insulating materials and its reliability by using the Arrhenius approach. Arrhenius equation presents generally accepted practice for assessing reliability, life-time, and degree of decomposition of a material. By demonstrating a typical aging experiment in electrical engineering, the paper explains the test design, selection method, and proof of the testing concept for measuring activation energy in practice. On the base of measured activation energy, the paper further deals with the evaluation of obtained data and their suitability for use in the Arrhenius equation. Moreover, the paper also observes the temperature dependence of different interaction rates among chemical reactions and its influence on the material during the thermal decomposition.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF18_069%2F0009855" target="_blank" >EF18_069/0009855: Electrical Engineering Technologies with High-Level of Embedded Intelligence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2020 International Conference on Diagnostics in Electrical Engineering (Diagnostika) : CDEE 2020

  • ISBN

    978-1-72815-879-2

  • ISSN

    2464-7071

  • e-ISSN

    2464-708X

  • Number of pages

    4

  • Pages from-to

    20-23

  • Publisher name

    University of West Bohemia in Pilsen

  • Place of publication

    Pilsen

  • Event location

    Pilsen, Czech Republic

  • Event date

    Sep 1, 2020

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article