Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43967087" target="_blank" >RIV/49777513:23220/22:43967087 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21670/22:00357010
Result on the web
<a href="https://iopscience.iop.org/article/10.1088/1748-0221/17/01/C01025/meta" target="_blank" >https://iopscience.iop.org/article/10.1088/1748-0221/17/01/C01025/meta</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/17/01/C01025" target="_blank" >10.1088/1748-0221/17/01/C01025</a>
Alternative languages
Result language
angličtina
Original language name
Experimental study of the adaptive gain feature for improved position-sensitive ion spectroscopy with Timepix2
Original language description
In the present work, we study the Timepix2 pixels' high energy response in the so-called adaptive gain mode. Therefore, Timepix2 with a 500 μm thick silicon sensor was irradiated with protons of energies in the range from 400 keV to 2 MeV and α-particles of 5.5 MeV from 241Am. A novel method was developed to determine the energy deposit in single pixels of particle imprints, which are spread out over a set of neighbor pixels (cluster). We show that each pixel is capable of measuring the deposited energy from 4 keV up to ∼3.2 MeV. Reconstructing the full energy content of the clusters, we found relative energy resolutions (σE) better than 2.7% and better than 4% for proton and α-particle data, respectively. In a simple experiment with a 5.5 MeV α-particle source, we demonstrate that energy losses in thin (organic) specimen can be spatially resolved, mapping out sample thickness variations, with a resolution around 1-2 μm, across the sensor area. The inherent spatial resolution of the device was determined to be 350 nm in the best case.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10303 - Particles and field physics
Result continuities
Project
<a href="/en/project/EF16_019%2F0000766" target="_blank" >EF16_019/0000766: Engineering applications of microworld physics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
1748-0221
Volume of the periodical
17
Issue of the periodical within the volume
1
Country of publishing house
GB - UNITED KINGDOM
Number of pages
10
Pages from-to
nestrankovano
UT code for WoS article
000757419300004
EID of the result in the Scopus database
2-s2.0-85125543199