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Thin-film silicon solar cells: stability and light trapping

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F09%3A00504369" target="_blank" >RIV/49777513:23640/09:00504369 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Thin-film silicon solar cells: stability and light trapping

  • Original language description

    Thin-film silicon solar cell technology is one of the promising photovoltaic technologies for delivering low-cost solar electricity. Today the thin-film silicon PV market (402 MWp produced in 2008) is dominated by amorphous silicon based modules; howeverit is expected that the tandem amorphous/microcrystalline silicon mo-dules will take over in near future. The properties of silicon films grown from the mixture of hydrogen and silane will be discussed and the solar cell behavior will be presented. In order to increase the absorption in thin absorber layers novel approaches for photon management inside solar cells are developed. In this article i) optimal surface texture of the electrodes for introducing efficient light scattering and ii) development and implementation of optically-active layers for enhanced reflection at the back contact are presented.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/1M06031" target="_blank" >1M06031: Materials and components for environment protection</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2009

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS

  • ISSN

    0352-9045

  • e-ISSN

  • Volume of the periodical

    39

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    SI - SLOVENIA

  • Number of pages

    8

  • Pages from-to

  • UT code for WoS article

    000277050900009

  • EID of the result in the Scopus database