Sensitivity analysis of high temperature spectral emissivity measurement method

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F15%3A43925704" target="_blank" >RIV/49777513:23640/15:43925704 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.infrared.2015.04.005" target="_blank" >http://dx.doi.org/10.1016/j.infrared.2015.04.005</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.infrared.2015.04.005" target="_blank" >10.1016/j.infrared.2015.04.005</a>

Result language
angličtina
Original language name
Sensitivity analysis of high temperature spectral emissivity measurement method
Original language description
Computer model of temperature distribution in the sample in high temperature spectral emissivity measurement method is introduced. Sensitivity analysis is performed using computer model to determine the effect of various measurement method parameters onthe sample temperatures. The effects of measured and reference coating thicknesses, measured coating emissivity and sample surface temperature are analyzed. The utilization of temperature difference between reference coating surface and the interface ofreference and measured coatings for total emissivity uncertainty of measured coating is demonstrated.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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