Lock-in and pulsed thermography for solar cells testing
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F18%3A43951602" target="_blank" >RIV/49777513:23640/18:43951602 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1364/AO.57.000D90" target="_blank" >http://dx.doi.org/10.1364/AO.57.000D90</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/AO.57.000D90" target="_blank" >10.1364/AO.57.000D90</a>
Alternative languages
Result language
angličtina
Original language name
Lock-in and pulsed thermography for solar cells testing
Original language description
Inspection of solar cells is an important part of their production process, because even their small defects can cause a significant drop of a whole photo-voltaic module performance. LED illuminated lock-in (LEDILIT) and flash-pulse (FPT) thermographic techniques were compared in this study. Lock-in methods are more commonly used for solar cells inspection. The aim of the study was to find out if the FPT is appropriate for an inspection of defects of multicrystalline solar cells. Experimental setup, inspection results and advantages/disadvantages of both methods are presented. It was confirmed that the LEDILIT produced more clear indications. The FPT was not so efficient, but it was much faster and could detect many of defects also indicated by LEDILIT. FPT also indicated inhomogeneities at a bottom layer of a cell, which were not connected with a photo-voltaic effect and which were not revealed by LEDILIT
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Optics
ISSN
1559-128X
e-ISSN
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Volume of the periodical
57
Issue of the periodical within the volume
18
Country of publishing house
US - UNITED STATES
Number of pages
8
Pages from-to
"D90"-"D97"
UT code for WoS article
000435841800014
EID of the result in the Scopus database
2-s2.0-85048952570