Structural analysis of Ni-doped SrTiO3: XRD study

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F19%3A43957628" target="_blank" >RIV/49777513:23640/19:43957628 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1063/1.5119475" target="_blank" >http://dx.doi.org/10.1063/1.5119475</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.5119475" target="_blank" >10.1063/1.5119475</a>

Result language

angličtina

Original language name

Structural analysis of Ni-doped SrTiO3: XRD study

Original language description

The aim of this work is to study the structure of Ni-doped SrTiO3 thin films by X-ray diffraction (XRD). All samples were prepared by magnetron sputtering on Si and SiO2 substrates. The main objective of this work is to monitor the crystallization of the deposited thin layer of Ni-doped SrTiO3. The X-ray diffraction measurements were done on the films as deposited and after annealing in vacuum up to 900°C. The x-ray analysis was used with both geometries (symmetric and asymmetric). Those measurements allow us to get information about the influence of Ni on the final structure, the size of crystallites, the micro-strains and the deformation of the lattice. In particular, here we demonstrate that Ni doping lead to the unique stabilisation of crystall growth of SrTiO3 as compared to the undoped SrTiO3.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

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OECD FORD branch

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Project

<a href="/en/project/EF15_003%2F0000358" target="_blank" >EF15_003/0000358: Computational and Experimental Design of Advanced Materials with New Functionalities</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2019

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

APCOM 2019 - APPLIED PHYSICS OF CONDENSED MATTER

ISBN

978-0-7354-1873-8

ISSN

0094-243X

e-ISSN

1551-7616

Number of pages

5

Pages from-to

"NESTRÁNKOVÁNO"

Publisher name

American Institute of Physics Inc.

Place of publication

Bratislava

Event location

Strbske Pleso; Slovakia

Event date

Jun 19, 2019

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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