Radiation Damage of Selected Electronic Components
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG15__%2F03%3A3K301_13" target="_blank" >RIV/60162694:G15__/03:3K301_13 - isvavai.cz</a>
Alternative codes found
RIV/60162694:G43__/05:ZÁZNAM16
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Radiation Damage of Selected Electronic Components
Original language description
Paper presents behaviour of selected electronic components during their exposition by the neutrons. Both components, optron and semiconductor memory have shown some nonreversible damage of their function.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of Applied Electronics
ISBN
80-7082-951-6
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
224-227
Publisher name
ZČU Plzeň
Place of publication
Plzeň
Event location
Plzeň
Event date
Sep 10, 2003
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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