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Ant Colony Optimization Based Algorithm for Test Path Generation Problem with Negative Constraints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG42__%2F25%3A00563694" target="_blank" >RIV/60162694:G42__/25:00563694 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21230/24:00378799

  • Result on the web

    <a href="https://ieeexplore.ieee.org/xpl/conhome/9724650/proceeding" target="_blank" >https://ieeexplore.ieee.org/xpl/conhome/9724650/proceeding</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/QRS62785.2024.00075" target="_blank" >10.1109/QRS62785.2024.00075</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Ant Colony Optimization Based Algorithm for Test Path Generation Problem with Negative Constraints

  • Original language description

    Path-based testing is an established method for creating test cases comprising sequences of steps executed in a System Under Test (SUT). Several algorithms for generating the test sequences (paths) that satisfy various test coverage criteria determining their properties are published in the literature. However, existing path-based testing techniques have limited applicability in numerous practical cases, such as when executing a particular test step in the test further excludes the execution of another test step. More complex exclusion requirements (further denoted negative constraints) exist in real systems, depending on the number of executions of a particular test step. In the paper, we discuss two possible negative constraints, namely, (1) the complete exclusion of a step as a consequence of the execution of a particular previous step and (2) the requirement to include a particular step maximally once in one test path, when another step was executed previously. We present a novel ant-colony-optimization (ACO) principle-based algorithm, accepting a SUT model based and a set of negative constraints, and computing a set of test paths while maximizing edge coverage and satisfying the given set of negative constraints. We compare the results of the ACO-based algorithm with those returned by a baseline, an alternative algorithm that excludes specific test paths from a set of test paths satisfying edge coverage, and, for reference, with results returned by an algorithm that generates test paths that satisfy edge coverage. Evaluated on 152 problem instances, the presented ACO-based algorithm outperformed the baseline in the average length of test paths (representing the testing costs) lower by 32.62%. Also, the ratio of edge coverage satisfaction in the set of test paths computed by the ACO-based algorithm is better by 3.41% compared to the baseline.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    50900 - Other social sciences

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    IEEE International Conference on Software Quality Reliability and Security

  • ISBN

    979-8-3503-6563-4

  • ISSN

    2693-9185

  • e-ISSN

    2693-9177

  • Number of pages

    12

  • Pages from-to

    701-712

  • Publisher name

    IEEE COMPUTER SOC

  • Place of publication

  • Event location

    Cambridge, ENGLAND

  • Event date

    Jul 1, 2024

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article

    001327094200065