Accelerated Life Test as a Tool Evaluating the Influence of a Manufacturing Error on Electronic Device Reliability

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F11%3A00436951" target="_blank" >RIV/60162694:G43__/11:00436951 - isvavai.cz</a>
Result on the web
<a href="http://vavtest.unob.cz/registr" target="_blank" >http://vavtest.unob.cz/registr</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Accelerated Life Test as a Tool Evaluating the Influence of a Manufacturing Error on Electronic Device Reliability
Original language description
The paper deals with an accelerated life test that was used to evaluate difference in reliability of two sets of electronic items. The first set included correct manufactured items and the second in correct manufactured items. The aim of the test was toverify if errors during manufacturing process have an effect on item reliability. The article describes experimental arrangements and test results evaluation methodology.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Selected papers from the Fourth International Conference on Risk Analysis (ICRA4)
ISBN
978-3-8440-0060-3
ISSN
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e-ISSN
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Number of pages
11
Pages from-to
141-151
Publisher name
Shaker Verlag
Place of publication
Achen
Event location
Limassol, Cyprus
Event date
Jan 1, 2011
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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