Reliability Estimation of Electronic Components by Step-Stress Accelerated Reliability Testing

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F19%3A00536911" target="_blank" >RIV/60162694:G43__/19:00536911 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/8813409" target="_blank" >https://ieeexplore.ieee.org/document/8813409</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DT.2019.8813409" target="_blank" >10.1109/DT.2019.8813409</a>

Result language
angličtina
Original language name
Reliability Estimation of Electronic Components by Step-Stress Accelerated Reliability Testing
Original language description
Step-stress accelerated reliability testing is a useful tool in reliability estimation, which allows collecting failure time data of test units in a short period of time. This paper describes methodology how to design, perform and evaluate the step-stress accelerated reliability testing for electronic components used in combat vehicles. The experiment has been conducted on light-emitting diodes (LEDs).
Czech name
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Czech description
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Project
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Continuities
S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
The International Conference on Information and Digital Technologies 2019
ISBN
978-1-7281-1401-9
ISSN
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e-ISSN
2575-677X
Number of pages
5
Pages from-to
376-380
Publisher name
IEEE
Place of publication
Zilina, Slovakia
Event location
Zilina, Slovakia
Event date
Jun 25, 2019
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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