All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F20%3A00556839" target="_blank" >RIV/60162694:G43__/20:00556839 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.rpsonline.com.sg/proceedings/esrel2020/pdf/4153.pdf" target="_blank" >https://www.rpsonline.com.sg/proceedings/esrel2020/pdf/4153.pdf</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.3850/978-981-14-8593-0_4153-cd" target="_blank" >10.3850/978-981-14-8593-0_4153-cd</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Evaluation of Electronic Components Degradation Using the Accelerated Reliability Testing Data

  • Original language description

    The accelerated reliability testing is a useful tool to quickly obtain information about reliability of products. ART are widely used in the automotive and electrotechnical industries to estimate or verify the reliability parameters of component and system, to improve product reliability through detection of potential defects, to evaluate and compare products of different manufacturers. During the technical life, the majority of electronic component show degradation characteristics (degradation of individual technical parameters). This article describes the methodology how to evaluate reliability of electronic components in combat vehicles through degradation analysis of accelerated reliability testing data. In degradation analysis, basic mathematical models are used to extrapolate the performance measurements over time to the point where the product would have degraded beyond a limit value. When the degradation parameter exceeds a limit value, it can be considered a failure because test unit will be useless after those degradation levels. The paper demonstrate a practical application of the proposed method in the case of light emitting diodes, where process of degradation consists in degradation of light intensity.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 30th European Safety and Reliability Conference andthe 15th Probabilistic Safety Assessment and Management Conference

  • ISBN

    978-981-14-8593-0

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    1516-1521

  • Publisher name

    Research Publishing

  • Place of publication

    Singapore

  • Event location

    Venice, Italy

  • Event date

    Nov 1, 2020

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article