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Three-parameter Weibull distribution with upper limit applicable in reliability studies and materials testing

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F23%3A00558235" target="_blank" >RIV/60162694:G43__/23:00558235 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.sciencedirect.com/science/article/pii/S0026271422002931" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0026271422002931</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.microrel.2022.114769" target="_blank" >10.1016/j.microrel.2022.114769</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Three-parameter Weibull distribution with upper limit applicable in reliability studies and materials testing

  • Original language description

    The Weibull plot with concave shape of an experimental curve mostly indicates the necessity to use the three-parameter Weibull distribution with nonzero location parameter, which represents the lower limit of studied data set. The paper proposes a three-parameter Weibull distribution function with the localization parameter representing the upper limit of the studied data set. This function is suitable for the Weibull plot with convex shape of experimental curve. Several examples of applying the newly proposed function are presented: for lifetime or time-to-breakdown in reliability studies and for strength properties in materials testing.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronics Reliability

  • ISSN

    0026-2714

  • e-ISSN

    1872-941X

  • Volume of the periodical

    137

  • Issue of the periodical within the volume

    October

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    10

  • Pages from-to

    114769

  • UT code for WoS article

    000862867200008

  • EID of the result in the Scopus database

    2-s2.0-85137060291