Use of Factor Analysis in Pattern Recognition

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60460709%3A41310%2F18%3A78816" target="_blank" >RIV/60460709:41310/18:78816 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1088/1742-6596/1065/17/172003" target="_blank" >http://dx.doi.org/10.1088/1742-6596/1065/17/172003</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1742-6596/1065/17/172003" target="_blank" >10.1088/1742-6596/1065/17/172003</a>

Result language

angličtina

Original language name

Use of Factor Analysis in Pattern Recognition

Original language description

Pattern recognition deals with obtaining and processing certain data on objects in the real world aimed at characterizing their common properties and classifying them with respect to these properties into classes. This paper deals with a method of pattern recognition with respect to the basic position of images. Factor analysis is used for classification. Factor analysis is a special statistical method using the same features and pattern classes as in discriminant analysis. The m dimensional vector is an input parameter. The method can classify into n groups of patterns. Pattern recognition can work in real time.

Czech name

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Czech description

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Type

J_SC - Article in a specialist periodical, which is included in the SCOPUS database

CEP classification

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OECD FORD branch

20205 - Automation and control systems

Project

—

Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Physics: Conference Series

ISSN

1742-6588

e-ISSN

1742-6588

Volume of the periodical

1065

Issue of the periodical within the volume

17

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

4

Pages from-to

1-4

UT code for WoS article

—

EID of the result in the Scopus database

2-s2.0-85057458329