Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F02%3A00006460" target="_blank" >RIV/60461373:22310/02:00006460 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/02:02030560
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
Original language description
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CA - Inorganic chemistry
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F02%2F0237" target="_blank" >GA202/02/0237: Electron transport processes near solid surfaces</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
J. Vac. Sci. Technol. A20
ISSN
0374-2101
e-ISSN
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Volume of the periodical
Neuveden
Issue of the periodical within the volume
2
Country of publishing house
US - UNITED STATES
Number of pages
9
Pages from-to
447-455
UT code for WoS article
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EID of the result in the Scopus database
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