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Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F08%3A00020061" target="_blank" >RIV/60461373:22310/08:00020061 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

  • Original language description

    Thickness dependence of refractive index and optical gap of PMMA layers prepared under electrical field

  • Czech name

    Závislost tloušťky indexu lomu a optického gapu PMMA vrstev připravených pod elektrickým polem

  • Czech description

    Závislost tloušťky indexu lomu a optického gapu PMMA vrstev připravených pod elektrickým polem

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CD - Macromolecular chemistry

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Materials Science: Materials in Electronics

  • ISSN

    0957-4522

  • e-ISSN

  • Volume of the periodical

    19

  • Issue of the periodical within the volume

    4

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    5

  • Pages from-to

  • UT code for WoS article

    000253050800013

  • EID of the result in the Scopus database