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Investigation of Ti/Al ohmic contact to N-type 6H-SiC

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F08%3A00020523" target="_blank" >RIV/60461373:22310/08:00020523 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Investigation of Ti/Al ohmic contact to N-type 6H-SiC

  • Original language description

    Investigation of Ti/Al ohmic contact to N-type 6H-SiC

  • Czech name

    Zkoumání Ti/Al ohmických kontaktů na N-typu 6H-SiC

  • Czech description

    Zkoumání Ti/Al ohmických kontaktů na N-typu 6H-SiC

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings The Seventh International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM 2008

  • ISBN

    978-1-4244-2325-5

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    Institute of Electrical Engineering Slovak Acadamy of Science

  • Place of publication

    Bratislava

  • Event location

    Smolenice, Slovensko

  • Event date

    Oct 12, 2008

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article