Application of Focused Ion Beam in materials science

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F10%3A00023129" target="_blank" >RIV/60461373:22310/10:00023129 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Application of Focused Ion Beam in materials science

Original language description

The fosuced ion beam is an instrument which allows imaging and precise milling of the material. It can reveal the structure in the third dimension as well as to prepare a lamella for transmission electron microscopy (TEM). The FIB combined with scanningelectron microscope (SEM) in one tool is an advanced technique for micro(nano)scale description of the materiasl in 3D and allows to define real size, shape and distribution of microstructural features such as grains, grain boundaries, phases, precipitates and micropores.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

JG - Metallurgy, metal materials

OECD FORD branch

—

Project

<a href="/en/project/KAN300100801" target="_blank" >KAN300100801: Multifunctional bulk metallic materials with nanocrystalline and ultrafine-grained structure</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Mikroskopie a nedestruktivní zkoušení materiálů

ISBN

978-80-7414-280-2

ISSN

—

e-ISSN

—

Number of pages

7

Pages from-to

—

Publisher name

UJEP

Place of publication

Ústí nad Labem

Event location

Litoměřice, Česká republika

Event date

Jan 1, 2010

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

—