Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F20%3A43920430" target="_blank" >RIV/60461373:22310/20:43920430 - isvavai.cz</a>

Result on the web

<a href="https://iopscience.iop.org/article/10.1088/2053-1583/aba9a0" target="_blank" >https://iopscience.iop.org/article/10.1088/2053-1583/aba9a0</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/2053-1583/aba9a0" target="_blank" >10.1088/2053-1583/aba9a0</a>

Result language

angličtina

Original language name

Spectroscopic thickness and quality metrics for PtSe2 layers produced by top-down and bottom-up techniques

Original language description

Thin films of noble-metal-based transition metal dichalcogenides, such as PtSe2, have attracted increasing attention due to their interesting layer-number dependent properties and application potential. While it is difficult to cleave bulk crystals down to mono- and few-layers, a range of growth techniques have been established producing material of varying quality and layer number. However, to date, no reliable high-throughput characterization to assess layer number exists. Here, we use top-down liquid phase exfoliation (LPE) coupled with centrifugation to produce PtSe2 nanosheets of varying sizes and thicknesses with a low degree of basal plane defectiveness. Measurement of the dimensions by statistical atomic force microscopy allows us to quantitatively link information contained in optical spectra to the dimensions. For LPE nanosheets we establish metrics for lateral size and layer number based on extinction spectroscopy. Further, we compare the Raman spectroscopic response of LPE nanosheets with micromechanically exfoliated PtSe2, as well as thin films produced by a range of bottom up techniques. We demonstrate that the Eg1 peak position and the intensity ratio of the Eg1/A1g1 peaks can serve as a robust metric for layer number across all sample types.This will be of importance in future benchmarking of PtSe2 films. © 2020 IOP Publishing Ltd

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

10402 - Inorganic and nuclear chemistry

Project

<a href="/en/project/GC20-16124J" target="_blank" >GC20-16124J: Two-dimensional layered transition metal dichalcogenides/ nanostructured carbons composites for electrochemical energy storage and conversion</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2020

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

2D MATERIALS

ISSN

2053-1583

e-ISSN

—

Volume of the periodical

7

Issue of the periodical within the volume

4

Country of publishing house

GB - UNITED KINGDOM

Number of pages

12

Pages from-to

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UT code for WoS article

000573289600001

EID of the result in the Scopus database

2-s2.0-85092564456