Thin Organic Layers Diagnostics by Image Analysis

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22340%2F10%3A00023434" target="_blank" >RIV/60461373:22340/10:00023434 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Thin Organic Layers Diagnostics by Image Analysis
Original language description
Image processing has wide range of applications at field of a modern science. This presented work deals with thin organic layers diagnostic by image analysis. Thin layers were prepared by spin coating method. Solution of coated material in suitable volatile solvent is applied onto surface of a rotating substrate in this method. Solvent is evaporated and centrifuged. After finalization of the spinning process thin layer of coated material is created onto the substrate. Prepared thin layers were diagnosedby image analysis. Used instruments were optical microscope; digital camera and software NIS-Elements AR 2.30 type Advanced Research by Laboratory Imaging company. An image analysis technique was used to measure dependences of degree of coverage of thesubstrate surface on the concentration, the speed of rotation and the spinning time.
Czech name
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Czech description
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Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of 9th International Conference Process Control 2010
ISBN
978-80-7399-951-3
ISSN
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e-ISSN
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Number of pages
1
Pages from-to
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Publisher name
Tribun EU, s.r.o.
Place of publication
Brno
Event location
Kouty nad Desnou (CZ)
Event date
Jan 1, 2010
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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