Comparison of resolution estimation methods in optical microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22340%2F18%3A43915674" target="_blank" >RIV/60461373:22340/18:43915674 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/18:00323518
Result on the web
<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10752/107522Q/Comparison-of-resolution-estimation-methods-in-optical-microscopy/10.1117/12.2321301.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10752/107522Q/Comparison-of-resolution-estimation-methods-in-optical-microscopy/10.1117/12.2321301.short</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2321301" target="_blank" >10.1117/12.2321301</a>
Alternative languages
Result language
angličtina
Original language name
Comparison of resolution estimation methods in optical microscopy
Original language description
Super-resolution (SR) microscopy is a powerful technique which enhances the resolution of optical microscopes beyond the diffraction limit. Recent SR methods achieve the resolution of 100 nm. Theoretical resolution enhancement can be mathematically defined. However, the final resolution in the real image can be influenced by technical limitations. Evaluation of resolution in a real sample is essential to assess the performance of an SR technique. Several image based resolution limit evaluation methods exist, but the determination of cutoff frequency is still a challenging task. In order to compare the efficiency of assessing resolution methods, the reference estimation technique is necessary. There exist several conventional methods in digital image processing. In this paper, the most common resolution measurement techniques used in the optical microscopy imaging are presented and their performance compared. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
Czech name
—
Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/GA17-05840S" target="_blank" >GA17-05840S: Multicriteria Optimization of Shift-Variant Imaging System Models</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE Volume 10752 Applications of Digital Image Processing XLI
ISBN
978-1-5106-2076-6
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
8
Pages from-to
"107522Q-1"-"107522Q-8"
Publisher name
SPIE Society of Photo-Optical Instrumentation Engineers
Place of publication
Washington
Event location
San Diego
Event date
Aug 20, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000450861700091