Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F19%3A00520350" target="_blank" >RIV/61388955:_____/19:00520350 - isvavai.cz</a>

Alternative codes found

RIV/68378271:_____/19:00520350

Result on the web

<a href="https://doi.org/10.1016/j.apsusc.2019.06.083" target="_blank" >https://doi.org/10.1016/j.apsusc.2019.06.083</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2019.06.083" target="_blank" >10.1016/j.apsusc.2019.06.083</a>

Result language

angličtina

Original language name

Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy

Original language description

We used angular-resolved C 1s, O 1s, and Cu 3p photoelectron spectra to acquire non-destructive concentration depth profiles and for in-depth distribution of resolved bonding states by Maximum Entropy Method

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10403 - Physical chemistry

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2019

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Surface Science

ISSN

0169-4332

e-ISSN

—

Volume of the periodical

491

Issue of the periodical within the volume

Oct

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

8

Pages from-to

16-23

UT code for WoS article

000479082900003

EID of the result in the Scopus database

2-s2.0-85067692813