Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F21%3A00541681" target="_blank" >RIV/61388955:_____/21:00541681 - isvavai.cz</a>
Result on the web
<a href="http://hdl.handle.net/11104/0319212" target="_blank" >http://hdl.handle.net/11104/0319212</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2021.149254" target="_blank" >10.1016/j.apsusc.2021.149254</a>
Alternative languages
Result language
angličtina
Original language name
Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering
Original language description
In this article we explore the potential of synchrotron Grazing Incidence Small Angle X-ray Scattering (GISAXS) to evaluate the extension of a Photoinduced Resist-free Imprinting (PRI) effect for grating-like Laser Induced Periodic Surface Structures (LIPSS) on spin-coated thin films of the fullerene derivative [6,6]-phenyl C-71-butyric acid methyl ester (PC71BM). Valuable information about the nature of both the original fullerene LIPSS and of the remaining resist-free nanostructure in terms of geometry, size distribution, lattice periodicity and degree of order can be achieved by simulations of the GISAXS patterns. One of the most interesting features provided by the GISAXS analysis is the estimation of the paracrystalline distortion factor, which can be useful to evaluate the level of order in the nanostructure. Data revealed that LIPSS in PC71BM films can be described as onedimensional paracrystalline lattices with levels of order in accordance with those typically observed in LIPSS of other materials. The PRI effect leaves a qualitatively similar nanostructure but about two times more disordered than the original LIPSS one. Our results show that GISAXS is a powerful tool to characterize Resist-free Imprinting procedures of potential relevance in nanotechnology.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10403 - Physical chemistry
Result continuities
Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
1873-5584
Volume of the periodical
548
Issue of the periodical within the volume
MAY 2021
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
9
Pages from-to
149254
UT code for WoS article
000624474700005
EID of the result in the Scopus database
2-s2.0-85101331505