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Depth-resolved analysis of historical painting model samples by means of laser-induced breakdown spectroscopy and handheld X-ray fluorescence

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388980%3A_____%2F18%3A00493046" target="_blank" >RIV/61388980:_____/18:00493046 - isvavai.cz</a>

  • Alternative codes found

    RIV/60461446:_____/18:N0000013 RIV/60461446:52810/18:N0000031 RIV/00216224:14310/18:00106466 RIV/00216305:26620/18:PU128320

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.sab.2018.05.018" target="_blank" >http://dx.doi.org/10.1016/j.sab.2018.05.018</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.sab.2018.05.018" target="_blank" >10.1016/j.sab.2018.05.018</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Depth-resolved analysis of historical painting model samples by means of laser-induced breakdown spectroscopy and handheld X-ray fluorescence

  • Original language description

    Paintings represent composed materials arranged in successive layers. Development of a suitable method for a depth-profiling analysis is essential for acquiring the information on the stratigraphy as well as on the chemical composition of individual layers, revealing the pigments which had been used. In this study, a depth-resolved analysis of multi-layered model samples of historical easel paintings was performed by means of laser-induced breakdown spectroscopy (LIBS) in combination with non-invasive X-ray fluorescence (XRF). The LIBS analysis was carried out using modified laser ablation system, UP-266 MACRO, equipped with a Czerny-Turner spectrometer. The XRF analysis was performed by handheld spectrometer, Delta Premium. In LIBS experiments, a set of six spots was examined with 5, 10, 15, 20, 25 and 30 pulses respectively, for each of the studied paint samples. Digital and 3D optical microscopy was employed to measure individual layer thickness and to obtain the information on average ablation rates of each sample. The chemical composition of the model samples with each layer partly uncovered was known, and this enabled to directly compare the results obtained by LIBS depth profiling with a fast analysis carried out with the handheld XRF spectrometer. The LIBS depth profiling proved to be a suitable method to distinguish layers of a different material composition and estimate their thickness. The combined use of LIBS and XRF analyses offered essential complementary information on the elemental composition of analysed multi-layered samples.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10406 - Analytical chemistry

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Spectrochimica Acta Part B: Atomic Spectroscopy

  • ISSN

    0584-8547

  • e-ISSN

  • Volume of the periodical

    147

  • Issue of the periodical within the volume

    SEP

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    9

  • Pages from-to

    100-108

  • UT code for WoS article

    000445167800013

  • EID of the result in the Scopus database

    2-s2.0-85047633855